Bob W0EG 2022/06/24 13:15

Wery good highly detailed article in the July/August edition of QEX "Improved Low-Loss Measurements with a NanoVNA".

Experiments determine how to reliably measure low valued insertion losses using the NanoVNA.

The author describes the advantage of doing a one port measurement on the DUT terminated with open and short vs. typical S21 for insertion loss.

The two  measurements are averaged and taken as twice the insertion loss.